Electron-microscope study of the effect of chlorhexidine on Pseudomonas aeruginosa
Richards, R.M.; Cavill, R.H.
Microbios 26(104): 85-93
1979
ISSN/ISBN: 0026-2633 PMID: 121759 Document Number: 152328
Electron micrographs of cytological damage to log phase Pseudomonas aeruginosa caused by low consentrations of chlorhexidine indicate an action primarily on the cytoplasmic membrane at concentration of 2.0--3.0 micrograms/ml chlorhexidine, and on the cytoplasmic membrane plus layers external to it at concentrations greater than 3.0 micrograms/ml. Evidence of two types of resistance to chlorhexidine is presented.