Effect of Genes Controlling Radiation Sensitivity on Chemically Induced Mutations in SACCHAROMYCES CEREVISIAE
Prakash, L.
Genetics 83(2): 285-301
1976
ISSN/ISBN: 0016-6731 PMID: 17248715 Document Number: 100808
The effect of 16 different genes (rad) conferring radiation sensitivity on chemically induced reversion in the yeast S. cerevisiae was determined. The site of reversion used as a well-defined chain initiation mutant mapping in the structural gene coding for iso-1-cytochrome c. High doses of EMS was used as the mutagen, every rad gene tested, except for rad14, had an effect on reversion; rad6, rad9, rad15, rad17, rad18, rad22, rev1, rev2 and rev3 lowered NQO reversion while rad1, rad2, rad3, rad4, rad10, rad12 and rad16 increased it compared to the RAD+ strain. The effect of rad genes on chemical mutagenesis is discussed in terms of their effect on UV mutagenesis. It is concluded that although the nature of the repair pathways may differ for UV- and chemically-induced mutations in yeast, a functional repair system is required for the induction of mutation by the chemical agents NQO, EMS and HNO2.