Hardness development of self-adhesive resin cement in simulated root canal
Ding, H.; Lan, W.; Meng, X.
Hua Xi Kou Qiang Yi Xue Za Zhi 30(3): 243-246
2012
ISSN/ISBN: 1000-1182 PMID: 22768758 Document Number: 659797
To compare the hardness development of dual-cured self-adhesive and universal resin cement in simulated root canal. The light-proof half-cylinder steel slot with one end open were syringed and filled respectively by self-adhesive A (RelyX Unicem), B (BisCem) and universal C (DUOLINK) resin cements, then the open end of slot was irradiated directly by a light unit for 20 s. Specimens were stored in a light-proof box for 0.5 h, Knoop microhardness was measured along the vertical surfaces of specimens from 1 mm to 10mm depth at 1 mm intervals. The same measurements were taken at 24 h and 120 h after irradiation. Data were analyzed by One-way ANOVA. Hardness of each group decreased with the increase of simulated canal depth (P<0.001), however hardness showed no significant change between 5 mm and more depth of group A, between 4 mm and more depth of group B and C. The increase of hardness for each group was more rapid within 0.5 h after irradiation, thereafter the hardness increased gradually to maximum at 24 h. At 120 h after irradiation, hardness of group C was greater than that of other two groups at more than 1 mm depth (P<0.001). Under dual-cured condition, hardness has significant difference between self-adhesive and universal resin cements, however their hardness development is similar.