Elemental microanalysis of enamel and dentin by secondary ion mass spectrometry (SIMS) . Deciduous and permanent teeth from high and low fluoride area

Petersson, L.G.; Lodding, A.; Koch, G.

Swedish Dental Journal 2(2): 41-54

1978


ISSN/ISBN: 0347-9994
PMID: 274828
Document Number: 127886

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