Mechanistic studies on the neighboring base damage induced by KMnO4 oxidation of 8-oxoguanine in DNA
Fukuoka, M.; Yamauchi, T.; Koizume, S.; Inoue, H.; Ohtsuka, E.
Nucleic Acids Symposium Series 37: 81-82
1997
ISSN/ISBN: 0261-3166 PMID: 9586009 Document Number: 469495
New types of DNA substrates containing an 8-oxoguanine residue (8-oxo-G) were prepared in order to examine the mechanisms for the neighboring base damage initiated by KMnO4 oxidation of the 8-oxo-G. The results obtained from the reactions suggested that the damage at remote sites in the single strands can be explained by an electronic interaction (redox reaction) between an oxidized 8-oxo-G species and the base (to be damaged), which are close each other in a loop structure. For the inefficient damage observed in duplex substrates, electron transfer through stacked bases might be involved.